KEMET F1 Technology and Simulated Breakdown Screening

KEMET’s F1 Technology package incorporates three process methodologies for improved anode quality.

• Two of these technologies aid in slowing the crystallization process that naturally occurs in the anode. By minimizing oxygen and carbon content in our anodes, we address two of the main contaminants that can lead to crystallization of the anode.
• The remaining technology provides a stronger mechanical connection point between the Ta lead wire and Ta anode, thus improving robustness and product reliability.

KEMET has developed a special patented screening technique which allows the identification of capacitors with hidden defects in the dielectric, without any damage to the general population of the capacitors.

The screening is based on the simulation of breakdown voltage (BDV) without actually damaging the capacitors. The BDV test is an ultimate test of the dielectric in a capacitor.

Low BDV indicates defects in the dielectric and, therefore, higher probability of failure in the field.

High BDV indicates stronger dielectric and high-reliability performance in the field. This new screening method allows KEMET to identify the breakdown voltage of each individual capacitor so that we provide only the strongest capacitors from each lot.

These technologies are offered in the following arrangements:

• F1 Technology alone
• Simulated Breakdown Screening alone
• Combination of both F1 and Simulated Breakdown Screening technologies

Features & Benefits

F1 Technology

• Based on fundamental understanding of degradation mechanisms in Tantalum and Niobium capacitors
• Significantly reduces defects in the dielectric that could potentially grow resulting in dielectric failures

SBDS

• Patent number
  US 7,671,603 B2
• Non-destructive testing technique which allows determination of breakdown voltage (BDV) of a capacitor without damage to its dielectric

Combination of F1 & SBDS

• Provides highest reliability
• Provides highest average BDV
• Screens parts with BDV below standard deviation average

KEMET Products